Methods include chemical vapor deposition and various physical vapor deposition techniques. U. S. Army Engineer Research and Development Laboratories, Fort Belvoir, Virginia. xref Up to 20 films may be entered. Derives exact expressions for the absorption cross sections of 1D systems. 0000000676 00000 n All Rights Reserved, Only if other resources available (images, video, datasets), • Use these formats for best results: Smith or J Smith, Journal of Optical Communications and Networking, Journal of the Optical Society of America A, Journal of the Optical Society of America B, Journal of Display Technology (2005-2016), Journal of the Optical Society of Korea (1997-2016), Journal of Optical Networking (2002-2009), Journal of the Optical Society of America (1917-1983), Conference on Lasers and Electro-Optics (CLEO), Conference on Lasers and Electro-Optics/Pacific Rim, Integrated Photonics Research, Silicon and Nanophotonics, Ray Tracing Using the IBM Card Programmed Electronic Calculator*, Computation of Trichromatic Coordinate Using the IBM 604 Electronic Calculating Punch, Use of a Digital Readout Unit in Converting Spectrophotometric Data to Color Coordinates, Automatic Computation of Dielectric Films. J. Opt. 0000008608 00000 n Soc. 83 0 obj<>stream Am. Soc. Shows that the Fourier transform of the reflection amplitude reveals all classical rays. Provides examples where the simplest rays already produce near perfect results. 0000001886 00000 n Click here to see what's new. <<776C51471BACE84084940A6AE664887B>]>> 0000004504 00000 n Learn more about our response to COVID-19 including information for. 0000006680 00000 n 0000002432 00000 n You may subscribe either as an OSA member, or as an authorized user of your institution. The basic formulas which are utilized in the calculations are given together with the essential details of the machine program, including a macro-flow diagram. Note the Boolean sign must be in upper-case. Am. Use quotation marks " " around specific phrases where you want the entire phrase only. J. Opt. 65 19 When designing a thin film, though the wavelength of light and angle of incidence are usually specified, the index of refraction and thickness of layers can be varied to optimize performance. Use these formats for best results: Smith or J Smith, Use a comma to separate multiple people: J Smith, RL Jones, Macarthur. The equation T + R + A = 1describes the theory, where T=transmittance, R=reflectance, and A=absorptance. . Reflectance at wavelengths from 200 nm to 2000 nm may be calculated. 0000007456 00000 n This website uses cookies to deliver some of our products and services as well as for analytics and to provide you a more personalized experience. In this paper, constructing explicit, exact ray solutions of the one-dimensional Helmholtz equation as a model for optically thin solar cells, we show that the ray-wave duality is also exact in the context of the electromagnetic wave equations. We use cookies to help provide and enhance our service and tailor content and ads. 50(2) 137-143 (1960), Milton Laikin In fact, 70 years ago, in the context of quantum mechanics, Feynman showed that rays, properly equipped with phases and correctly summed, provide exact solutions of the quantum mechanical wave equation. Treating the one-dimensional case exactly, our paper lays the foundation for constructing exact ray theories for application to solar cell absorption cross section in two and three dimensions. 0000003800 00000 n Bortchagovsky Institute of Semiconductor Physics of National Academy of Sciences of Ukraine, pr. 45(9) 772-772 (1955), Fred W. Billmeyer 0000001359 00000 n Calculate reflectance due to thin-film interference by entering your films below. You do not have subscription access to this journal. Asterisk ( * ) -- Example: "elect*" retrieves documents containing "electron," "electronic," and "electricity", Question mark (?) ]yE^$��K�"%������p�\Ǐn?696�8~̜��Q��4ǦY��ȋ�R����m``�``26v� ���AL�I*�2J@�0��Y��Sb`��%-�j% {:�-c�e��Af!�yL��:�&1=c�ɘ�����0���4F.F��n�����.0r1�eH`Ta8����h�VF�K��@�0`��2� �b��u � �:@� �zr� or 65 0 obj <> endobj 0000002677 00000 n Note: Author names will be searched in the keywords field, also, but that may find papers where the person is mentioned, rather than papers they authored. © 2018 The Authors. %%EOF . The phase difference becomes δπλ=(201)ntand the film has an index of refraction larger than that of the substrate. Students will consider the most common case for thin films, that being normal incidence (θ0=0rad). Thin Solid Films Volume 307, Issues 1–2 , 10 October 1997, Pages 192-199 Ellipsometric method for investigation of the optical anisotropy of thin films: theory and calculations Contact your librarian or system administrator Soc. They can be engineered to control the amount of light reflected or transmitted at a surface for a given wavelength. We introduce a complex index of refraction in order to include absorption. Soc. trailer You do not have subscription access to this journal. 0000005988 00000 n Am. Soc. J. Opt. endstream endobj 66 0 obj<> endobj 67 0 obj<> endobj 68 0 obj<>/ProcSet[/PDF/Text]/ExtGState<>>> endobj 69 0 obj<> endobj 70 0 obj<> endobj 71 0 obj<> endobj 72 0 obj<> endobj 73 0 obj<> endobj 74 0 obj<>stream Thin films are used commercially in anti-reflection coatings, mirrors, and optical filters. Soc. Presents an exact ray solution of the 1D Helmholtz equation with a complex refractive index as a model for thin solar cells. Example: (diode OR solid-state) AND laser [search contains "diode" or "solid-state" and laser], Example: (photons AND downconversion) - pump [search contains both "photons" and "downconversion" but not "pump"]. H�|T�n�0��+x��Z�˲�� Copyright © 2020 Elsevier B.V. or its licensors or contributors. 0000008219 00000 n startxref Cited by links are available to subscribers only. The total contribution ρ of all of the rays of our subclass to the total reflection amplitude r is (D.1) ρ = ∑ p = 0 ∞ ∑ q = 0 ∞ p + q p t 1 2 t 2 2 p + 2 r 1 p r 2 q e i k [2 (p + 1) n 1 a 1 + 2 (p + q + 1) n 2 a 2], where t 1 and r 1 are transmission amplitude and right-reflection amplitude at the vacuum/film interface, t 2 and r 2 are transmission amplitude and right-reflection amplitude at the film/film interface, a 1 is the …

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